K5-501 & K5-503 modules (pre-rad) @ System Test
Setup
- K5-501 is the module with 1 dead channel per chip.
- K5-503 is the module with perfect chips.
- K5-501 mounted on the sector, position O12
- K5-503 mounted on the sector, position O13
- Problems to readout Link1 of K5-501. 12 chips readout via Link0.
- Hyb. Temp K5-501 = 38ºC.
- Vdet(K5-501) = 150V. Idet = 0.9uA.
- Hyb. Temp K5-503 = 41ºC.
- Vdet(K5-503) = 150V. Idet = 1uA.
- Both modules were tested at the same time, except for the Noise Occupancy
Scans. The trimming at different ranges forced testing one at a time.
Strobe Delay Scan
The Strobe Delay Scan give "good" curves. No sign of what we see on the test
box.
Three Point Gain (untrimmed)
The gain and noise versus channel number is flat.
The mean input noise value for K5-501 is ~1540 e- and for K5-503 is ~1620 e-.
Trimming
The trimming gives 9 channels masked for K5-501. Many of the chips are
trimmed at Trim Range 2.
The trimming gives 2 channels masked for K5-503. All chips are trimmed in
Trim Range 0. There is one channel (260) not connected to the detectors
(cut trace at fanin) and 2 noisy channels (385 & 386) that appeared after
bonding. These last 2 are the masked ones.
Response Curve (trimmed)
The gain and noise versus channel number is flat.
The mean input noise value for K5-501 is ~1575 e- and for K5-503 is ~1600 e-.
Noise Occupancy Scan
The Noise Occupancy @ 1fC is 3.35E-5 for K5-501.
The Noise Occupancy @ 1fC is 4.34E-5 for K5-503.
Timewalk
In both modules the Timewalk is around 12 ns.
K5-501 & K5-503 modules (pre-rad) @ System Test
Last Updated October 12, 2002.
© IFIC 2002